728x90 Contrast1 NILS & MEEF Normalized Image Log Slope (NILS) is a metric used to evaluate the image quality of lithographic masks, which are used in semiconductor manufacturing to transfer circuit patterns onto silicon wafers. NILS is a measure of the contrast of an aerial image of a mask pattern, which is the image of the pattern that is formed in the air above the mask when it is illuminated by light. It is calculated a.. 2023. 4. 18. 이전 1 다음 728x90
